CHASE PINTO DRY BEAN

被引:30
作者
COYNE, DP [1 ]
NULAND, DS [1 ]
LINDGREN, DT [1 ]
STEADMAN, JR [1 ]
机构
[1] UNIV NEBRASKA,DEPT PLANT PATHOL,LINCOLN,NE 68583
关键词
PHASEOLUS-VULGARIS; RUST; COMMON BACTERIAL BLIGHT; HALO BLIGHT; BACTERIAL BROWN SPOT; WHITE MOLD;
D O I
10.21273/HORTSCI.29.1.44
中图分类号
S6 [园艺];
学科分类号
0902 ;
摘要
引用
收藏
页码:44 / 45
页数:2
相关论文
共 7 条
[1]  
COYNE DP, 1983, HORTSCIENCE, V18, P30
[2]  
DICKSON MH, 1977, ANN RPT BEAN IMP COO, V20, P38
[3]   CHOOSING PLANT CULTIVARS BASED ON THE PROBABILITY OF OUTPERFORMING A CHECK [J].
ESKRIDGE, KM ;
MUMM, RF .
THEORETICAL AND APPLIED GENETICS, 1992, 84 (3-4) :494-500
[4]   HARD-TO-COOK PHENOMENON IN BEANS - EFFECTS OF ACCELERATED STORAGE ON WATER-ABSORPTION AND COOKING TIME [J].
JACKSON, GM ;
VARRIANOMARSTON, E .
JOURNAL OF FOOD SCIENCE, 1981, 46 (03) :799-803
[5]  
NULAND D, 1992, BEAN BAG NEB DRY BEA, P12
[6]  
SINGH SP, 1982, BEAN IMPR COOP NEW Y, V25, P92
[7]  
VALLADARESSANCHEZ NE, 1983, J AM SOC HORTIC SCI, V108, P272