ELECTRONIC LIMITATIONS IN PHASE METERS FOR HETERODYNE INTERFEROMETRY

被引:50
作者
OLDHAM, NM [1 ]
KRAMAR, JA [1 ]
HETRICK, PS [1 ]
TEAGUE, EC [1 ]
机构
[1] US DEPT COMMERCE,NATL INST STAND & TECHNOL,TECHNOL ADM,METROL BLDG,ROOM A117,BLDG 220,GAITHERSBURG,MD 20899
来源
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING | 1993年 / 15卷 / 03期
关键词
PHASE METERS; HETERODYNE INTERFEROMETRY;
D O I
10.1016/0141-6359(93)90005-U
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Limitations imposed by the phase meters used in heterodyne interferometers are evaluated. These instruments measure the phase relationship between electrical signals generated by the heterodyning process, allowing the interferometers to resolve fractions of an optical fringe. Measurements indicate that the phase meters used in currently available heterodyne interferometers probably limit achievable accuracy to a greater extent than barriers imposed by the optics. We show that a new class of time interval counters offers a means of greatly improving accuracy in these instruments.
引用
收藏
页码:173 / 179
页数:7
相关论文
共 13 条
[1]  
Quenelle, Nonlinearity in interferometric measurements, Hewlett-Packard J., 34, (1983)
[2]  
Reinboth, Wilkening, Optische phasenschieber fur zweifrequenz-laser-interferometer, PTB-Mitteilungert, 93, pp. 168-174, (1983)
[3]  
Bobroff, Residual errors in laser interferometry from air turbulence and nonlinearity, Applied Optics, 26, pp. 2676-2682, (1987)
[4]  
Sutton, Non-linearity in length measurement using heterodyne laser Michelson interferometry, J Phys E Sci Instrum, 20, pp. 1290-1292, (1987)
[5]  
Tanaka, Yamagami, Nakayami, Linear interpolation of periodic error in a heterodyne laser interferometer at subnanometer levels, I.E.E.E. Trans Instrum Meas, 38, pp. 552-554, (1989)
[6]  
Augustyn, Davis, An analysis of polarization mixing errors in distance measuring interferometers, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 8, pp. 2032-2036, (1990)
[7]  
Rosenbluth, Bobroff, Optical sources of nonlinearity in heterodyne interferometers, Precision Engineering, 12, pp. 57-61, (1990)
[8]  
Bowen, Chetwynd, Schwarzenberger, Sub-nanometer displacement calibration using x-ray interferometry, Meas Sci Technol, 1, pp. 107-119, (1990)
[9]  
Hou, Wilkening, Investigation and compensation of the non-linearity of heterodyne interferometers, Progress in Precision Engineering: Proceedings of the 6th International Precision Engineering Seminar (IPES6), pp. 1-14, (1991)
[10]  
Teague, The NIST Molecular Measuring Machine Project metrology and precision engineering design, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 7, pp. 1898-1902, (1989)