DISCREPANCIES BETWEEN ABSORPTION AND PHOTOCONDUCTIVITY MEASUREMENTS IN SILICON INVERSION LAYERS

被引：12

作者：

KAMGAR, A ^{[1
]}

TSUI, DC ^{[1
]}

STURGE, MD ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

SOLID STATE COMMUNICATIONS | 1977年 / 24卷 / 01期

关键词：

D O I：

10.1016/0038-1098(77)90562-2

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

收藏

页码：47 / 50

页数：4

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