THE STUDY OF GRAIN-BOUNDARY THICKNESS USING ELECTRON-DIFFRACTION TECHNIQUES

被引:31
作者
CARTER, CB
DONALD, AM
SASS, SL
机构
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1980年 / 41卷 / 04期
关键词
D O I
10.1080/01418618008239326
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
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收藏
页码:467 / 475
页数:9
相关论文
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