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FAULT ISOLATION IN CONVENTIONAL LINEAR SYSTEMS - A PROGRESS REPORT
被引:6
作者
:
MAENPAA, JH
论文数:
0
引用数:
0
h-index:
0
机构:
Scully International, Inc., Downers Grove
MAENPAA, JH
STEHMAN, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
Scully International, Inc., Downers Grove
STEHMAN, CJ
STAHL, WJ
论文数:
0
引用数:
0
h-index:
0
机构:
Scully International, Inc., Downers Grove
STAHL, WJ
机构
:
[1]
Scully International, Inc., Downers Grove
[2]
Autonetics Division, North American Rockwell Corporation, Anaheim
[3]
Web Press Engineering, Addison
[4]
Greyhound Computer Corporation, Chicago
来源
:
IEEE TRANSACTIONS ON RELIABILITY
|
1969年
/ R 18卷
/ 01期
关键词
:
D O I
:
10.1109/TR.1969.5216962
中图分类号
:
TP3 [计算技术、计算机技术];
学科分类号
:
0812 ;
摘要
:
A computer program is described which implements a previously suggested procedure for isolating faults in conventional linear systems. The technique is based on the analysis of network function responses at critically chosen test frequencies applied to the normal input-output terminals of the circuit under test. The feasibility of the diagnosis technique is discussed in terms of the experience with the computer program and some empirical studies which have been conducted. Example circuits are included which have been processed by the computer program. Problem areas related to both the basic theory of the technique and the computational limitations of implementation are defined. Solutions are proposed for some of these problems; others are merely defined for study by the circuit theorists. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.
引用
收藏
页码:12 / &
相关论文
共 2 条
[1]
MAYEDA W, 1965, IEEE T CIRCUIT THEOR, VCT12, P181
[2]
SESHU S, 1966, IEEE RELIAB, VR 15, P11
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1
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共 2 条
[1]
MAYEDA W, 1965, IEEE T CIRCUIT THEOR, VCT12, P181
[2]
SESHU S, 1966, IEEE RELIAB, VR 15, P11
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1
→