A SIMPLE WAY TO STUDY SECONDARY ION EMISSION BY HEAVY MULTICHARGED IONS AT MEDIUM ENERGY (= 115 KEV) - APPLICATION TO HYDROGEN-ION EMISSION

被引：7

作者：

BRUNELLE, A

DELLANEGRA, S

DEPAUW, J

JORET, H

LEBEYEC, Y

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1989年 / 43卷 / 04期

关键词：

D O I：

10.1016/0168-583X(89)90411-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：586 / 588

页数：3

共 6 条

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BECKER, O ;

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LEBEYEC, Y ;

MONART, B ;

STANDING, K ;

WIEN, K .

JOURNAL DE PHYSIQUE, 1987, 48 (02) :261-266

[5] NEUTRALIZATION OF MULTIPLY CHARGED IONS AT A SURFACE [J].

VARGA, P .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 44 (01) :31-41

[6] CHARGE OF RECOIL ATOMS AFTER ALPHA DECAY [J].

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