IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE

被引：223

作者：

COWLEY, JM

机构：

[1] School of Physics, University of Melbourne, Parkville

来源：

APPLIED PHYSICS LETTERS | 1969年 / 15卷 / 02期

关键词：

D O I：

10.1063/1.1652901

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The appearance of phase-contrast, Fresnel fringes and various forms of diffraction contrast in images produced by transmission scanning electron microscopes can be understood simply by invoking the principle of reciprocity to equate the imaging conditions to those relevant to a conventional electron microscope. © 1969 The American Institute of Physics.

引用

页码：58 / &

共 9 条

[1]

COWLEY JM, 1969, 2 ANN SCANN EL MICR

[2]

COWLEY JM, 1968, 4 EUR REG C ROM

[3] A HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPE [J].