LIFETIME SPECTRA (77 DEGREES K) OF NITROGEN-DOPED GAAS1-XPX

被引:7
作者
LEE, MH
HOLONYAK, N
NELSON, RJ
KEUNE, DL
GROVES, WO
机构
[1] UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
[2] UNIV ILLINOIS,MAT RES LAB,URBANA,IL
[3] MONSANTO CO,ST LOUIS,MO 63166
关键词
D O I
10.1063/1.321695
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1290 / 1298
页数:9
相关论文
共 32 条
[1]  
[Anonymous], 1970, J LUMIN, DOI DOI 10.1016/0022-2313(70)90054-2
[2]   MEASUREMENT OF EXTRINSIC ROOM-TEMPERATURE MINORITY CARRIER LIFETIME IN GAP [J].
BACHRACH, RZ ;
LORIMOR, OG .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (02) :500-&
[3]   THE DETERMINATION OF THE FLUORESCENCE LIFETIMES OF DISSOLVED SUBSTANCES BY A PHASE SHIFT METHOD [J].
BAILEY, EA ;
ROLLEFSON, GK .
JOURNAL OF CHEMICAL PHYSICS, 1953, 21 (08) :1315-1322
[4]   EFFECT OF CRYSTAL COMPOSITION ON QUASIDIRECT RECOMBINATION AND LED PERFORMANCE IN INDIRECT REGION OF GAAS1-XPX-N [J].
CAMPBELL, JC ;
HOLONYAK, N ;
KUNZ, AB ;
CRAFORD, MG .
APPLIED PHYSICS LETTERS, 1974, 25 (01) :44-47
[5]   RECOMBINATION TRANSITIONS IN ZN-N-DOPED GAAS1-CHI P CHI IN DIRECT AND INDIRECT COMPOSITION REGIONS [J].
CAMPBELL, JC ;
HOLONYAK, N ;
LEE, MH ;
LUDOWISE, MJ ;
CRAFORD, MG ;
FINN, D ;
GROVES, WO .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (02) :795-799
[6]   INTERFEROMETRIC PHASE SHIFT TECHNIQUE FOR MEASURING SHORT FLUORESCENT LIFETIMES [J].
CARBONE, RJ ;
LONGAKER, PR .
APPLIED PHYSICS LETTERS, 1964, 4 (02) :32-&
[8]  
Craford M. G., 1973, Journal of Electronic Materials, V2, P137, DOI 10.1007/BF02658108
[9]   EFFECT OF TE AND S DONOR LEVELS ON PROPERTIES OF GAAS1-XPX NEAR DIRECT-INDIRECT TRANSITION [J].
CRAFORD, MG ;
STILLMAN, GE ;
ROSSI, JA ;
HOLONYAK, N .
PHYSICAL REVIEW, 1968, 168 (03) :867-&
[10]   RADIATIVE RECOMBINATION MECHANISMS IN GAASP DIODES WITH AND WITHOUT NITROGEN DOPING [J].
CRAFORD, MG ;
SHAW, RW ;
HERZOG, AH ;
GROVES, WO .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) :4075-&