A COMPARISON OF X-RAY-METHODS FOR STRUCTURE REFINEMENT OF LANGMUIR-BLODGETT MULTILAYERS

被引：15

作者：

REICHE, J

PIETSCH, U

FINK, HP

LEMMETYINEN, H

机构：

[1] UNIV POTSDAM,DEPT PHYS,O-1571 POTSDAM,GERMANY

[2] FRAUNHOFER INST APPL POLYMER RES,O-1530 TELTOW,GERMANY

[3] UNIV HELSINKI,DEPT PHYS CHEM,SF-00170 HELSINKI 17,FINLAND

来源：

ACTA POLYMERICA | 1992年 / 43卷 / 04期

关键词：

D O I：

10.1002/actp.1992.010430404

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

The possibilities and limits of structure refinement of Langmuir-Blodgett films by means of symmetrical reflection of X-rays are described using the example of a stearic acid multilayer. Three different techniques for the determination of the electron density profile from reflectivity data are compared: a Fourier method, a Patterson method, and model calculations. The important role of the a priori information for finding the best structure model is outlined.

引用

页码：206 / 209

页数：4

共 19 条

[1]

ABLES F, 1950, ANN PHYSIQUE, V5, P597

[2]

[Anonymous], 1970, XRAY DIFFRACTION MET

[3] EVIDENCE OF CHAIN INTERDIGITATION IN LANGMUIR-BLODGETT-FILMS [J].