FREQUENCY-DEPENDENCE OF DIELECTRIC LOSS IN THIN AROMATIC POLYIMIDE FILMS

被引:16
作者
ABOELFOTOH, MO
FEGER, C
机构
[1] IBM Thomas J. Watson Research Center, Yorktown Heights, NY 10598
来源
PHYSICAL REVIEW B | 1993年 / 47卷 / 20期
关键词
D O I
10.1103/PhysRevB.47.13395
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The dielectric response of thin aromatic polyimide films with thicknesses ranging from 400 to 3 X 10(4) angstrom has been measured in the frequency range 10(4)-10(9) Hz. The results show the presence of two components of dielectric polarization. One of these components exhibits a frequency dependence of the ''universal'' type omega(n-1) with n = 1.0 within experimental error, independent of film thickness, and is attributed to hopping electrons generated from excitation of a charge-transfer complex, followed by charge separation. The other component is characterized by a very low dielectric loss and is attributed to the pi-electron response of the dielectric lattice. The results indicate that film morphology plays an important role in determining the magnitude of the dielectric loss in the films, but does not affect its frequency dependence.
引用
收藏
页码:13395 / 13400
页数:6
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