ELECTRONIC SHEAR INTERFEROMETRY - APPLICATION OF A (DOUBLE-) PULSED-LASER

被引:19
作者
SPOOREN, R [1 ]
DYRSETH, AA [1 ]
VAZ, M [1 ]
机构
[1] UNIV PORTO, FAC ENGN, DEPT APPL MECH, P-4099 OPORTO, PORTUGAL
来源
APPLIED OPTICS | 1993年 / 32卷 / 25期
关键词
ELECTRONIC SHEAR INTERFEROMETRY; PULSED LASER; SPECKLE PHENOMENA;
D O I
10.1364/AO.32.004719
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The use of a double-pulsed laser in interferometric metrology relaxes the stability requirements for the experimental setup. The use of such a laser also makes it possible for one to study high-speed dynamic processes. We justify the use of a double-pulsed laser in electronic shear interferometry. We show how image subtraction can be applied to produce high-quality fringe patterns without a special aperture design. The fringe visibility is studied theoretically and is compared with the fringe visibility obtained when the closely related television-holography technique is used. The new double-pulse subtraction technique offers the possibility of compensation for laser intensity fluctuations that can affect the fringe visibility significantly in pulsed electronic shear interferometry.
引用
收藏
页码:4719 / 4727
页数:9
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