METALLURGICAL APPLICATIONS OF SIMS

[1] BOWER TF, 1966, T METALL SOC AIME, V236, P624

[2] BRYAN SR, 1986, P SIMS, V5, P235

[3] DEGREVE F, 1982, J MICROSC SPECT ELEC, V7, P243

[4] DEGREVE F, 1981, J MICROSC SPECT ELEC, V6, P223

[5] DEPTH PROFILING BY ION MICROPROBE WITH HIGH MASS RESOLUTION [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1979, 29 (04): : 351 - 361

[6] DEGREVE F, 1986, P SIMS, V5, P388

[7] DEGREVE F, 1986, APPLIED MATERIALS CH, V48, P241

[8] DEGREVE F, 1986, APR AFSM M GREN

[9] SIMS INVESTIGATIONS ON THE DIFFUSION OF CU IN AG SINGLE-CRYSTALS [J]. ACTA METALLURGICA, 1980, 28 (03): : 291 - 300

[10] DUBOST B, 1986, 3RD P INT AL LI C OX, P355

[1] BOWER TF, 1966, T METALL SOC AIME, V236, P624

[2] BRYAN SR, 1986, P SIMS, V5, P235

[3] DEGREVE F, 1982, J MICROSC SPECT ELEC, V7, P243

[4] DEGREVE F, 1981, J MICROSC SPECT ELEC, V6, P223

[5] DEPTH PROFILING BY ION MICROPROBE WITH HIGH MASS RESOLUTION [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1979, 29 (04): : 351 - 361

[6] DEGREVE F, 1986, P SIMS, V5, P388

[7] DEGREVE F, 1986, APPLIED MATERIALS CH, V48, P241

[8] DEGREVE F, 1986, APR AFSM M GREN

[9] SIMS INVESTIGATIONS ON THE DIFFUSION OF CU IN AG SINGLE-CRYSTALS [J]. ACTA METALLURGICA, 1980, 28 (03): : 291 - 300

[10] DUBOST B, 1986, 3RD P INT AL LI C OX, P355