MEASUREMENT OF ELASTIC-CONSTANTS OF MBE GROWN (GA0.5AL0.5)AS MIXED THIN-FILM CRYSTAL BY DIFFUSE-X-RAY SCATTERING

被引：8

作者：

KASHIWAGURA, N

KASHIHARA, Y

HARADA, J

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1986年 / 25卷 / 09期

关键词：

D O I：

10.1143/JJAP.25.1317

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1317 / 1322

页数：6

共 16 条

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[8]

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[9] ELEASTIC PROPERTIES OF ZNS STRUCTURE SEMICONDUCTORS [J].

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