S2F10 FORMATION IN COMPUTER-SIMULATION STUDIES OF THE BREAKDOWN OF SF6

被引:18
作者
HERRON, JT
机构
来源
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1987年 / 22卷 / 04期
关键词
D O I
10.1109/TEI.1987.298919
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
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页码:523 / 525
页数:3
相关论文
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