共 1 条
Analog circuit intelligent fault diagnosis based on GKPCA and multi-class SVM approach
被引:2
作者:
伞冶
郭珂
朱奕
机构:
[1] ControlandSimulationCenter,HarbinInstituteofTechnology
关键词:
D O I:
暂无
中图分类号:
TN710 [电子电路];
TP18 [人工智能理论];
学科分类号:
080902 ;
081104 ;
0812 ;
0835 ;
1405 ;
摘要:
Analog circuits fault diagnosis is essential for guaranteeing the reliability and maintainability of electronic systems. In this paper, a novel analog circuit fault diagnosis approach is proposed based on greedy kernel principal component analysis (KPCA) and one-against-all support vector machine (OAASVM). In order to obtain a successful SVM-based fault classifier, eliminating noise and extracting fault features are very important. Due to the better performance of nonlinear fault features extraction and noise elimination as compared with PCA, KPCA is adopted in the proposed approach. However, when we adopt KPCA to extract fault features of analog circuit, a drawback of KPCA is that the storage required for the kernel matrix grows quadratically, and the computational cost for eigenvector of the kernel matrix grows linearly with the number of training samples. Therefore, GKPCA, which can approximate KPCA with small representation error, is introduced to enhance computational efficiency. Based on the statistical learning theory and the empirical risk minimization principle, SVM has advantages of better classification accuracy and generalization performance. The extracted fault features are then used as the inputs of OAASVM to solve fault diagnosis problem. The effectiveness of the proposed approach is verified by the experimental results.
引用
收藏
页码:63 / 71
页数:9
相关论文