Time-resolved microscopy of laser photothermal imaging

被引：5

作者：

Koulikov, Serguei G. ^{[1
]}

Dlott, Dana D. ^{[1
]}

机构：

[1] Univ. of IL at Urbana-Champaign, Urbana, IL, United States

来源：

Optics and Photonics News | 2000年 / 11卷 / 06期

关键词：

Image quality - Laser applications - Light interference - Microscopic examination - Photographic films;

D O I：

10.1364/OPN.11.6.000026

中图分类号：

学科分类号：

摘要：

A time-resolved microscopic study of laser photothermal imaging was presented. Images were acquired in reflection, transmission and side-view geometries. Interference fringes between the substrate and imaging layers were seen in transmission around 20 ns. A novel behavior that helps to understand and optimize imaging materials to lower the laser exposure threshold was observed.

引用

页码：26 / 32