NANOSECOND RESOLVED X-RAY DIFFRACTION DURING PULSED LASER ANNEALING OF SILICON.

The pulsed nature of the X-rays emitted from the Cornell High Energy Synchrotron (CHESS) was utilized to carry out a diffraction study of the near-surface structure and temperature of silicon following pulsed ruby laser annealing. To the knowledge of the authors this was the first temporal X-ray diffraction investigation of a system at the nanosecond timescale. In this paper experimental details are described concerning the synchronization of the laser with the X-ray bursts along with a description of the data collection technique and experimental results.