Temperature dependence of the critical current density in YBa2Cu3O7-x

被引：10

作者：

Han, Sheng-chiang ^{[1
]}

机构：

[1] Acad Sinica, China

来源：

Physica C: Superconductivity and its Applications | 1988年 / 156卷 / 05期

关键词：

Ceramic Materials--Electric Properties - Oxides;

D O I：

10.1016/0921-4534(88)90156-6

中图分类号：

学科分类号：

摘要：

The temperature dependence of the critical current determined by S/N/S junctions is calculated and compared to experimental data in YBa2Cu3O7-x specimens. A quasi-two-dimensional S/N/S junction model is used to simulate the temperature dependence of Jc in the YBa2Cu3O7-x system. Our calculated results fit the experimental data well both in films and in bulk materials, indicating that the critical current is determined by S/N/S junctions, rather than by flux pinning strength.

引用

页码：765 / 768