SPM based storage

被引：17

作者：

Hosaka, Sumio ^{[1
]}

机构：

[1] Hitachi, Ltd, Tokyo, Japan

来源：

IEEE Transactions on Magnetics | 1996年 / 32卷 / 3 /2期

关键词：

Errors - Magnetic heads - Magnetic materials - Magnetic recording - Microscopes - Nanostructured materials - Readout systems - Servomechanisms;

D O I：

10.1109/20.492880

中图分类号：

学科分类号：

摘要：

The possibility of developing a scanning probe microscope (SPM) based storage system is discussed. The advantages of storage based on a scanning tunneling microscope (STM), an atomic force microscope (AFM), a magnetic force microscope (MFM) and a scanning near-field optical microscope (SNOM) are described in regard to recording bit size and readout speed. The AFM and SNOM based storages are expected to be used for future storages.

引用

页码：1873 / 1877