ERROR OF DISLOCATION DENSITY EVALUATION FROM A MICROGRAPH OF DENSELY SPACED DISLOCATION LINES.

被引：2

作者：

Kessler, Pavel ^{[1
]}

Orlova, Alene ^{[1
]}

机构：

[1] Acad of Sciences, Brno, Czech, Acad of Sciences, Brno, Czech

来源：

Materials science and engineering | 1986年 / 82卷

关键词：

CRYSTALLOGRAPHY - Mathematical Models - CRYSTALS - Dislocations - MICROSCOPIC EXAMINATION - Transmission Electron Microscopy;

D O I：

10.1016/0025-5416(86)90114-X

中图分类号：

学科分类号：

摘要：

The dislocation density is one of the most important structural parameters used in physical metallurgy. From various methods that have been suggested for its determination, the line intercept method evaluating the dislocation density from transmission electron micrographs of thin foils is probably that used most frequently. When the dislocation density is evaluated by the line intercept method from a micrograph of densely spaced dislocations, a certain fraction of dislocation intersections with the test lines may be missed by the observer. The resulting error can be interpreted by a limited resolution of dislocation images in counting the intersections. Our model allows the error either to be estimated or to be avoided by a choice of an appropriate magnification of the micrograph.

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