Accurate transmission line characterization

被引：71

作者：

Williams, Dylan F. ^{[1
]}

Marks, Roger B. ^{[1
]}

机构：

[1] Natl Inst of Standards and, Technology, Boulder, United States

来源：

IEEE Microwave and Guided Wave Letters | 1993年 / 3卷 / 08期

关键词：

Characterization - Dielectric materials - Electric impedance measurement - Electric losses - Electromagnetic dispersion - Electromagnetic wave transmission - Error analysis - Semiconducting silicon - Substrates - Transmission line theory;

D O I：

10.1109/75.242226

中图分类号：

学科分类号：

摘要：

This letter introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.

引用

页码：247 / 249