Electron-irradiation-induced phase transformation and fractional volatilization in (Mg, Fe)2SiO4 olivine thin films

被引：30

作者：

Carrez, Philippe ^{[1
]}

Leroux, Hugues ^{[1
]}

Cordier, Patrick ^{[1
]}

Guyot, François ^{[2
]}

机构：

[1] Laboratoire de SPES, Bâtiment C6, Univ. des Sci. et Technol. de Lille, 59655 Villeneuve d'Ascq Cedex, France

[2] Unite Mixte de Recherche Associee, CNRS 7590, Inst. de Physique du Globe de Paris, Case 115, 4 place Jussieu, 75252 Paris 05, France

来源：

| 2001年 / Taylor and Francis Ltd.卷 / 81期

关键词：

ACKNOWLEDGEMENTS The authors thank M. Bacia and P. Frangois for their help with the microscope and computers and are grateful to Pr. J. Cazaux (Faculti des Sciences; Reims; France) for helpful discussions. The authors also wish to thank an anonymous referee for useful suggestions. This work was supported by the Institut National des Sciences de 1’Univers of the CNRS through the ‘Programme National de Planitologie’;

D O I：

10.1080/01418610110053865

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摘要：

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