EFFECT OF CRYSTALLINITY ON THE MORPHOLOGY OF EVAPORATED Al-Ge THIN FILMS.

Al-Ge mixtures were co-evaporated onto glass substrates heated to approximately 180 degree C. At this temperature both the Al and the Ge were crystalline. Electron micrographs show a random structure. Resistivity measurements give a percolation threshold also indicating a random structure. These results are in contrast to the granular aluminum in an amorphous Ge matrix which is obtained on room temperature substrates, and support the correlation between crystallinity and morphology in evaporated films, as proposed by Deutscher et al.