基于主方向的直线检测算法

被引:3
作者
傅叶涛
杜昌平
赵耀
机构
[1] 浙江大学空天信息技术研究所
基金
中央高校基本科研业务费专项资金资助;
关键词
直线检测; 主方向; 主曲率; Hessian矩阵; 特征向量;
D O I
暂无
中图分类号
TP391.41 [];
学科分类号
080203 ;
摘要
针对直线自动检测具有重要的实际运用价值,提出了一种基于主方向的直线检测算法。首先,将灰度图像视作二维离散曲面,得到给定像素点的主曲率和主方向;其次因为直线上的像素的极小主方向近似为该直线的方向,所以利用直线像素方向一致性可用来提取直线像素;最后通过筛选直线像素并利用像素移位能够提高算法的精确度并减少算法耗时。理论分析和仿真数据表明基于主方向的直线检测算法和Hough变换、LSD、EDlines相比在耗时上占据优势,在相同环境下对同一图像进行检测,耗时分别为17.35 ms、182.10 ms、177.82 ms、17.71 ms。并且基于主方向检测算法的虚警率较低,产生的短线也较少。仿真实验结果证明了该算法在直线检测中的有效性和准确性,检测时间更短,稳定性相对于主流算法有所提高。
引用
收藏
页码:220 / 222+249 +249
页数:4
相关论文
共 14 条
[1]   An improved Hough transform voting scheme utilizing surround suppression [J].
Guo, Siyu ;
Pridmore, Tony ;
Kong, Yaguang ;
Zhang, Mang .
PATTERN RECOGNITION LETTERS, 2009, 30 (13) :1241-1252
[2]  
A novel Hough transform based on eliminating particle swarm optimization and its applications[J] . H.D. Cheng,Yanhui Guo,Yingtao Zhang. &nbspPattern Recognition . 2008 (9)
[3]  
Real-time line detection through an improved Hough transform voting scheme[J] . Leandro A.F. Fernandes,Manuel M. Oliveira. &nbspPattern Recognition . 2007 (1)
[4]   Applying the Hough transform pseudo-linearity property to improve computing speed [J].
Duquenoy, E. ;
Taleb-Ahmed, A. .
PATTERN RECOGNITION LETTERS, 2006, 27 (16) :1893-1904
[5]   A modified Hough transform for line detection and its performance [J].
Chutatape, O ;
Guo, LF .
PATTERN RECOGNITION, 1999, 32 (02) :181-192
[6]  
Automated visual inspection for microdrills in printed circuit board production. F -C Tien,C -H Yeh,K -H Hsieh. International Journal of Production Research . 2004
[7]  
Online recognition of Chinese characters: the state-of-the-art. CL Liu,S Jaeger,M Nakagawa. IEEE Transactions on Pattern Analysis and Machine Intelligence . 2004
[8]  
Extracting straight lines. Burns JB,Hanson AR,Riseman EM. IEEE Transactions on Pattern Analysis and Machine Intelligence . 1986
[9]  
LSD:a Line Segment Detector. von GIOI R G,JAKUBOWICZ J,MOREL J M. Image Processing On Line . 2012
[10]  
Fast camera calibration for the analysis of sport sequences. D. Farin,J. Han,P. de With. ICME . 2005