表面热透镜技术探测光学薄膜的微弱吸收

被引:16
作者
胡海洋
范正修
赵强
机构
[1] 中国科学院上海光学精密机械研究所!上海,中国科学院上海光学精密机械研究所!上海,EasternMichiganUniversity!Ypsilanti,MI,USA
关键词
表面热透镜技术; 热偏转技术; 薄膜; 弱吸收;
D O I
暂无
中图分类号
TN247 [光检测技术]; O484 [薄膜物理学];
学科分类号
080501 ; 1406 ;
摘要
对表面热透镜技术测量光学薄膜的微弱吸收进行了理论分析 ,并以此建立了薄膜微弱吸收测量实验装置 ,对几种典型薄膜的吸收进行了测试 ,证实了这种方法的可行性。
引用
收藏
页码:150 / 154
页数:5
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