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High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns .2 X Dai,O Sasaki,J E Greivenkamp,et al. Appl .Opt . 1997
[2]
Measurement of small rotation angles by using a parallel interference pattern .2 X Dai,O Sasaki,J E Greivenkamp,et al. Appl . Opt . 1995