[2]
l Raman m icrospectroscopy analy-sis of pressure-induced m etallization in scratch ing of silicon .2 Gogotsi Y,Zhou G,Ku S,et a. Sem i Sci&Tech . 2001
[2]
l Raman m icrospectroscopy analy-sis of pressure-induced m etallization in scratch ing of silicon .2 Gogotsi Y,Zhou G,Ku S,et a. Sem i Sci&Tech . 2001