共 5 条
[2]
Overview of catastrophic failures of freewheeling diodes in power electronic circuits[J] . R. Wu,F. Blaabjerg,H. Wang,M. Liserre.Microelectronics Reliability . 2013 (9-11)
[3]
Simulation study of a mixed terminal structure for 4H-SiC merged PiN/Schottky diode[J] . Huang Jian-Hua,Lü Hong-Liang,Zhang Yu-Ming,Zhang Yi-Men,Tang Xiao-Yan,Chen Feng-Ping,Song Qing-Wen.Chinese Physics B . 2011 (11)
[4]
Coupled measurement-simulation procedure for very high power fast recovery – Soft behavior diode design and testing[J] . F. Bertoluzza,P. Cova,N. Delmonte,P. Pampili,M. Portesine.Microelectronics Reliability . 2010 (9)
[5]
Analysis of the turn-off failure mechanism of silicon power diode[J] . Alex Q Huang,Victor Temple,Yin Liu,Yuanzhu Li.Solid State Electronics . 2002 (4)