基于模拟集成电路BIST的ARMA模块设计

被引：3

作者：

鞠家欣 ^{[1
]}

姜岩峰 ^{[1
,2
]}

于韶光 ^{[2
]}

机构：

[1] 北方工业大学信息工程学院微电子中心

[2] 北京自动测试技术研究所

来源：

关键词：

模拟集成电路; BIST; ARMA模块;

D O I：

暂无

中图分类号：

TN431.1 [线性集成电路、模拟集成电路];

学科分类号：

摘要：

针对模拟集成电路在线测试困难的特点,本文基于BIST结构对模拟集成电路的测试提出了一种新的测试方案,这种算法在测试电路中易于实现,并且容易嵌入到待测芯片中,为模拟集成电路可测试性设计提出了一种新的测试结构和测试算法。

引用

页码：56 / 62

页数：7

共 7 条

[1] Au-tomatic analog test signal generation using multifre-quency analysis. HUYNH S D,SEONGWON K,SOMA M,et al. Circuits and Systems II:Analogand Digital Signal Processing,IEEE Transactions on(see also Circuits and Systems II:Express Briefs,IEEE Transactions on . 1999
[2] Pseudo-random testing and signature analysis for mixed-signal circuit. Pan C Y,Cheng K T. Int Conf on CAD . 1995
[3] Mixed-signal Testing of Integrated Analog Circuits and Electronic Modules, Russ College of Engineering and Technology. Zhi-Hong Liu. . 1999
[4] A mixed-signal built-in self-test approach for analog circuits. C.Stroud,J.Morton,et al. Southwest Symposium on Mixed-Signal Design . 2003
[5] Analysis and generation of control and observation structures foranalog circuits. Yun-Che Wen,Kuen-Jong Lee. IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems . 2001
[6] Exact minimization of determinant decision diagrams. A.Manthe,C.-J.R.Shi. IEEE2002,International Conference on Communications,Circuits and Systems and West Sino Expositions . 2002
[7] Digital signature proposal for mixed-signal circuits. A.M.Brosa,J.Figueras. Proceedings of International Test Conference . 2000