微扫描多帧平滑FPN提高CMOS图像传感器信噪比

[1] Analysis and reduction of signal readout circuitry temporal noise in CMOS image sensors for low-light levels. DEGERLI Y,LAVERNHE F,MAGNAN P,et al. IEEE Transactions on Electron Devices . 2000

[2] Variable resolution CMOS current mode active pixel sensor. COULOMBE J,SAWAN M,WANG Chun-yan. Proceedings of IEEE International Symposium on Circuits and Systems . 2000

[3] Analysis of low fixed pattern noise cell structures for photoconversion layer overlaid CCD or CMOS image sensors. OHSAWA S,SASAKI M,MIYAGAWA R,et al. IEEE Transactions on Electron Devices . 1997

[4] Fixed pattern noise of amplified MOS imager in scaling down. ANDOH F,TANAKA K,KAWASHIMA H,et al. Electronics & Communications in Japan,Part II : Electronics . 1996

[5] On-focal -plane signal processing for current -mode active pixel sensors. NAKAMURA J,PAIN B,NOMOTO T,et al. IEEE Transactions on Electron Devices . 1997

[6] New design for a 1280 multiplied by 1024 digital CMOS image sensor with enhanced sensitivity, dynamic range and FPN. HO Jih-shin,CHIANG Ming-cheng,CHENG Han-min,et al. International Symposium on VLSI Technology, Systems, and Applications , Proceedings of IEEE . 1999

[7] A CMOS image sensor with a simple FPN-reduction technology and a hole accumulation diode. YONEMOTO K,SUMI H,SUZUKI R,et al. IEEE Journal of Solid State Circuits . 2000

[8] Performance analysis of a color CMOS photogate image sensor. BlANKSBY A J,LOINAZ M J. IEEE Transactions on Electron Devices . 2000

[1] Analysis and reduction of signal readout circuitry temporal noise in CMOS image sensors for low-light levels. DEGERLI Y,LAVERNHE F,MAGNAN P,et al. IEEE Transactions on Electron Devices . 2000

[2] Variable resolution CMOS current mode active pixel sensor. COULOMBE J,SAWAN M,WANG Chun-yan. Proceedings of IEEE International Symposium on Circuits and Systems . 2000

[3] Analysis of low fixed pattern noise cell structures for photoconversion layer overlaid CCD or CMOS image sensors. OHSAWA S,SASAKI M,MIYAGAWA R,et al. IEEE Transactions on Electron Devices . 1997

[4] Fixed pattern noise of amplified MOS imager in scaling down. ANDOH F,TANAKA K,KAWASHIMA H,et al. Electronics & Communications in Japan,Part II : Electronics . 1996

[5] On-focal -plane signal processing for current -mode active pixel sensors. NAKAMURA J,PAIN B,NOMOTO T,et al. IEEE Transactions on Electron Devices . 1997

[6] New design for a 1280 multiplied by 1024 digital CMOS image sensor with enhanced sensitivity, dynamic range and FPN. HO Jih-shin,CHIANG Ming-cheng,CHENG Han-min,et al. International Symposium on VLSI Technology, Systems, and Applications , Proceedings of IEEE . 1999

[7] A CMOS image sensor with a simple FPN-reduction technology and a hole accumulation diode. YONEMOTO K,SUMI H,SUZUKI R,et al. IEEE Journal of Solid State Circuits . 2000

[8] Performance analysis of a color CMOS photogate image sensor. BlANKSBY A J,LOINAZ M J. IEEE Transactions on Electron Devices . 2000