共 12 条
[1]
Vibrational probing technique for the nano-CMM based on optical radiation pres-sure control. Takaya Y,Imai K,Miyoshi T. Ann CIRP . 2004
[2]
Development of aSpecial CMM for dimensional metrology on microsystem compo-nents. Brand U,Kleine-Besten T,Schwenke H. Proceedings of the Annual Meeting of the ASPE . 2000
[3]
Development of a low costmicro-CMM for 3D micro/nano measurements. Fan K C,Fei Y T,Yu X F,et al. MeasurementScience and Technology . 2006
[4]
Development of High Precision Mechanical Probes for Coordinate Measuring Machines. Pril W O. . 2002
[5]
Microsystem metrology—The PTB special CMM. Yu L,Brand U,Muenchenhagen R,et al. Proc of International Symposium on Precision Mechanical Measurements . 2002
[6]
Probing systems for dimensional micro-and nano-metrology. A.Weckenmann,G.Peggs,J.Hoff mann. Measurement Science and Technology . 2006
[7]
Opto-tactile sensor for 2D and 3D measurement of small structures on coordinate measuring machines. Schwenke H,Waldele F,Weiskirch C,et al. Annals of the CIRP . 2001
[8]
Fiber deflection probe for small hole metrology. Muralikrishnan B,Stone J A,Stoup J R. Precision Engineering . 2006
[9]
Development and characterization of new probes for dimensional metrology on microsystem components. Kleine-Besten T,Loheide S,Brand U,et al. Proc EUS-PEN . 1999
[10]
Beginning of opera-tion and optimization of a 3D micro measuring device. Brand U,Yu L,Chang C,et al. Proc of the3rd EUSPEN International Confer-ence . 2002