一种基于电势分布的电容成像敏感分布计算方法

被引:19
作者
牟昌华
彭黎辉
姚丹亚
张宝芬
萧德云
机构
[1] 清华大学自动化系检测与电子技术研究所
关键词
电容成像; 图像重建; 敏感分布; 高斯定理;
D O I
10.19596/j.cnki.1001-246x.2006.01.014
中图分类号
TP274.4 [];
学科分类号
摘要
系统分析了电容成像(Electrical capacitance tomography,简称ECT)系统敏感分布和电势分布的关系,统一了计算公式,该方法简单且计算量小.仿真表明,采用该方法计算的ECT敏感分布,与采用定义计算的结果吻合.
引用
收藏
页码:87 / 92
页数:6
相关论文
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