大气单颗粒物中无机元素的二次离子质谱研究

被引:11
作者
梁汉东
于春海
刘咸德
周强
李艳芳
冯明德
机构
[1] 中国矿业大学北京校区化工与环境工程系!北京
[2] 国家环境分析检测中心!北京
[3] 中国矿业大学北京校区化工与环境
关键词
SIMS; 单颗粒物; 无机元素;
D O I
暂无
中图分类号
O657.63 [质谱分析];
学科分类号
摘要
采用飞行时间式二次离子质谱对大气单颗粒物 ( 2 0μm以下 )进行了探索性研究 ,并用硅片、铜片、镀银铜片和镀金铜片作为分析基片进行了对比实验 ;对以镀金铜片基片得到的谱图进行了金属元素分析 ,并与相同样品总颗粒物的 ICP- AES分析结果进行了比较 .结果表明 :镀金铜片基片的分析效果最佳 ;ICP- AES检测出的金属元素除 Cd外 ,在二次离子质谱图上均有体现 .因此 ,单颗粒物含有总颗粒物的“指纹”信息
引用
收藏
页码:20 / 23
页数:4
相关论文
共 9 条
[1]  
Depth-resolved chemical analysis of environmental micro-particles by secondary ion mass spectrometry. Goshnick J,Fichtner M. Applied Surface Science . 1993
[2]  
Real-time surface analysis of individual airborne environmental particles. Alexandru C L,Peter T A R. Environmental Science and Technology . 1999
[3]  
Slims analysis of aerosol collected during a weather period with low aerosol concentrations. Klaus N. Science of the Total Environment . 1985
[4]  
Microanalysis of individual environmental particles. Grieken R V,Xhoffer C. Journal of Analytical Science . 1992
[5]  
The configuration of impactor deposits analyzed by secondary ion mass spectroscopy. Klaus N. Science of the Total Environment . 1984
[6]  
Surface and depth analysis of pollen treated with atmosphere trace gas. Goshnick J,Schuricht J. Journal of Aerosol Science . 1996
[7]  
Microscope imaging by time-of -flight secondary ion mass spectrometry. Schueler B W. Microscopy Microanalysis Microstructure . 1992
[8]  
Recent advances in the analysis of individual environmental particle particle: Review. Jambers W,Bock L D,Grieken R V. The Analyst . 1995
[9]  
Application of secondary ion mass spectrometry to the identification of single particles of uranium and their isotopic measurement. Gabriele T,Maria B. Spectrochimica Acta Part B Atomic Spectroscopy . 1998