Competing causes of failure andreliability tests for weibull lifetimes under type I progressivecensoring..Uditha Balasooriya;Low C K;.IEEE Transactions on Reliability.2004, 01
Competing causes of failure andreliability tests for weibull lifetimes under type I progressivecensoring..Uditha Balasooriya;Low C K;.IEEE Transactions on Reliability.2004, 01