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[9]
A New Optimal Test Node Selection Method for Analog Circuit
[J] .
Hui Luo,Youren Wang,Hua Lin,Yuanyuan Jiang.  Journal of Electronic Testing .
2012
(3)
[10]
Module level fault diagnosis for analog circuits based on system identification and genetic algorithm
[J] .
Hui Luo,Youren Wang,Hua Lin,Yuanyuan Jiang.  Measurement .
2011
(4)