The robustness of series-connected high power IGBT modules.[J].C. Abbate;G. Busatto;L. Fratelli;F. Iannuzzo;B. Cascone;R. Manzo.Microelectronics Reliability.2007, 9
The robustness of series-connected high power IGBT modules.[J].C. Abbate;G. Busatto;L. Fratelli;F. Iannuzzo;B. Cascone;R. Manzo.Microelectronics Reliability.2007, 9