Symmetrical periods used as matching layers in multilayer thin film design

被引:4
作者
王丹
范正修
黄建兵
毕军
王英剑
机构
[1] ShanghaiInstituteofOpticsandFineMechanics,ChineseAcademyofSciences,Shanghai
关键词
Symmetrical periods used as matching layers in multilayer thin film design; IBS; Figure; high; LH;
D O I
暂无
中图分类号
O484.41 [];
学科分类号
0803 ;
摘要
<正>Properties of symmetrical layers as matching layers in multilayer thin film design were analyzed. A calculation method was presented to derive parameters of desired equivalent refractive index. A harmonic beam splitter was designed and fabricated to test this matching method.
引用
收藏
页码:675 / 677
页数:3
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