多信号流图的测试性建模与分析

[1] QSI’s Integrated Di-agnostics Toolset. Deb S,Pattipati K R,Shrestha R. Proc.IEEE Autotestcon . 1997

[2] 系统可测试性与航空武器系统 [J]. 测控技术, 1997, (02) : 8 - 10

[3] 系统测试性设计分析与验证[M]. 北京航空航天大学出版社 , 田仲,石君友编著, 2003

[4] 电子设备测试性及诊断技术[M]. 航空工业出版社 , 曾天翔主编, 1996

[5] The Impact ofCommercial Of the Shel(f COTS)Equipment On SystemTest and Diagnosis. William R Simpson,John W.Sheppard. Test Conference,Proceedings,International . 1993

[6] TEAMS:Testability Engineering and Maintenance Sys-tem Invited paper. Pattipati,K,Raghavan,V,Shakeri,M,Deb,S,and Shrestha,R. IEEE ACC,Baltimore,Maryland . 1994

[7] System Test andDiagnosis. William R Simpson,John W.Sheppard. . 1994

[8] MultiSignalFlow Graphs:A Novel Approach for System TestabilityAnalysis and Fault Diagnosis. Deb S,Pattipati K R,Raghavan V,Shakeri M. Proc.IEEE Autotestcon . 1994

[1] QSI’s Integrated Di-agnostics Toolset. Deb S,Pattipati K R,Shrestha R. Proc.IEEE Autotestcon . 1997

[2] 系统可测试性与航空武器系统 [J]. 测控技术, 1997, (02) : 8 - 10

[3] 系统测试性设计分析与验证[M]. 北京航空航天大学出版社 , 田仲,石君友编著, 2003

[4] 电子设备测试性及诊断技术[M]. 航空工业出版社 , 曾天翔主编, 1996

[5] The Impact ofCommercial Of the Shel(f COTS)Equipment On SystemTest and Diagnosis. William R Simpson,John W.Sheppard. Test Conference,Proceedings,International . 1993

[6] TEAMS:Testability Engineering and Maintenance Sys-tem Invited paper. Pattipati,K,Raghavan,V,Shakeri,M,Deb,S,and Shrestha,R. IEEE ACC,Baltimore,Maryland . 1994

[7] System Test andDiagnosis. William R Simpson,John W.Sheppard. . 1994

[8] MultiSignalFlow Graphs:A Novel Approach for System TestabilityAnalysis and Fault Diagnosis. Deb S,Pattipati K R,Raghavan V,Shakeri M. Proc.IEEE Autotestcon . 1994