magnetic force microscope;
perpendicular anisotropy;
stripe domain;
thin films;
D O I:
10.1016/S0304-8853(98)00646-5
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Epitaxial FePd (0 0 1) thin films grown by UHV sputtering onto different Pt buffer layers have been studied by magnetic force microscopy. Samples with buffer thickness down to 150 Angstrom present high perpendicular magnetic anisotropy. Both the stripe domain width and the magnetic contrast increase with the buffer thickness, in agreement with the anisotropy deduced from the hysteresis loops. (C) 1999 Elsevier Science B.V. All rights reserved.