共 30 条
[1]
Andre M. L., 1996, P SOC PHOTO-OPT INS, V3047, P38
[2]
Battersby C. L., 1998, P SOC PHOTO-OPT INS, V3578, P446
[3]
Quantitative depth profiling of ultra-shallow phosphorus implants in silicon using time-of-flight secondary ion mass spectrometry and the nuclear reaction 31P(α,p0)34S
[J].
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
2004, 225 (03)
:345-352
[4]
Brusasco R. M., 2002, P SOC PHOTO-OPT INS, V48, P4679
[7]
iTIRM as a tool for qualifying polishing processes
[J].
APPLIED OPTICS,
2002, 41 (19)
:4036-4038
[8]
Role of light intensification by cracks in optical breakdown on surfaces
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION,
2001, 18 (10)
:2607-2616
[9]
OPTICAL-GLASS FABRICATION TECHNOLOGY .2. RELATIONSHIP BETWEEN SURFACE-ROUGHNESS AND SUBSURFACE DAMAGE
[J].
APPLIED OPTICS,
1987, 26 (21)
:4677-4680
[10]
Enhancement of surface-damage resistance by removing a subsurface damage in fused silica
[J].
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2003,
2003, 5273
:244-249