Numerical simulations of submicron Co extruded elliptical dots were performed to illustrate the relative importance of different physical parameters on the switching behavior in the easy direction. Shape, size, magnetic moment magnitude, and the magnitude and distribution of the crystalline anisotropicity were varied. The simulation represents magnetostatic, exchange, and crystalline anisotropicity fields on a structured mesh using finite difference techniques. The smooth boundary of the dots is accurately represented by use of the embedded curve boundary method. Agreement with experimental hysteresis measurements of submicron dot arrays is obtained when an appropriate angular distribution of the grain anisotropicity axes is invoked. (C) 2000 American Institute of Physics. [S0021-8979(00)78508-2].
