Automated Xe adsorption technique to measure small Brunauer-Emmett-Teller surface area of several square centimeters

被引:1
作者
Yanazawa, H
Furukawa, R
Yamamoto, S
Suzuki, I
Miura, K
机构
[1] ASET, Assoc Super Adv Elect Technol, Totsuka Ku, Yokohama, Kanagawa 2440817, Japan
[2] Hitachi Ltd, Device Dev Ctr, Tokyo 1988512, Japan
[3] Utsunomiya Univ, Fac Educ, Utsunomiya, Tochigi 3218505, Japan
[4] Tsuyama Natl Coll Technol, Numa, Tsuyama 7080824, Japan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2001年 / 19卷 / 06期
关键词
D O I
10.1116/1.1421564
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An automated Xe adsorption apparatus has been developed that enables the measurement of a Brunauer-Emmett-Teller (BET) surface area of several cm 2 with a repeatability of 4% (standard deviation). The apparatus is equipped with a differential type capacitance manometer, each hand of which is connected to a sample and reference adsorption cell having a symmetrical design, that is the temperature-compensated volumetric system which was reported by one of the authors [L Suzuki, Rev. Sci. Instrum. 53, 1061 (1982); ibid., 66, 5070 (1995); ibid., 68, 4531 (19981)], All procedures for measuring gas adsorption are computer controlled, and the coolant meniscus height is also computer controlled to keep the adsorption cell volume constant. A specially polished Si crystal rod was adopted as the standard sample. The BET surface area of the standard sample was measured by both the original temperature-compensated system and the newly developed automated system. Obtained results are fully consistent. We propose the adsorption cross section of Xe to be 0.25 nm(2) based on our measurements. In addition, we demonstrate a series of experimental results which show a quantitative correlation between the capacitance and surface microroughness of a capacitor with rugged surface electrode. (C) 2001 American Vacuum Society.
引用
收藏
页码:2262 / 2267
页数:6
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