Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials

被引:70
作者
Tian, HH [1 ]
Atzmon, M
机构
[1] Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
[2] Univ Michigan, Dept Nucl Engn & Radiol Sci, Ann Arbor, MI 48109 USA
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1999年 / 79卷 / 08期
关键词
D O I
10.1080/01418619908210391
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The Warren-Averbach (WA) analysis of X-ray Bragg-peak broadening, as well as simplified methods, are employed in the characterization of a set of nanocrystalline Fe powder samples with a wide range of grain sizes. In the WA analysis. the hook effect present at short times is attributed to small-angle grain boundaries. A universal relationship between grain size and rms strain is observed for all samples. For subtraction of instrumental peak broadening, a parabolic relation is found to yield the closest approximation to iterative convolution. Among the integral breadth methods, assuming that both strain and grain size broadening result in a Cauchy peak shape yields the largest grain size and smallest strain. Assuming that both contributions result in Gaussian peaks does the opposite, providing the closest approximation of the WA volume-averaged grain size. The Scherrer equation shows fortuitous agreement with the WA area-averaged grain size. The simplified methods can lead to severe systematic errors when the peak shape varies between samples.
引用
收藏
页码:1769 / 1786
页数:18
相关论文
共 40 条
[1]  
[Anonymous], 1969, XRAY DIFFRACTION
[2]   PROFILE FITTING OF X-RAY-DIFFRACTION LINES AND FOURIER-ANALYSIS OF BROADENING [J].
BALZAR, D .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1992, 25 :559-570
[3]  
Balzar D, 1996, J APPL CRYSTALLOGR, V29, P16, DOI 10.1107/S0021889895008478
[4]  
Brown A., 1980, ADV XRAY ANAL, V23, P361
[5]   DETERMINATION OF CRYSTALLITE SIZE AND LATTICE-DISTORTIONS THROUGH X-RAY-DIFFRACTION LINE-PROFILE ANALYSIS - RECIPES, METHODS AND COMMENTS [J].
DELHEZ, R ;
DEKEIJSER, TH ;
MITTEMEIJER, EJ .
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1982, 312 (01) :1-16
[6]   CORRECTIONS FOR ANGLE DEPENDENCE OF LORENTZ, POLARIZATION AND STRUCTURE FACTORS IN X-RAY-DIFFRACTION LINE-PROFILES [J].
DELHEZ, R ;
MITTEMEIJER, EJ ;
KEIJSER, THD ;
ROZENDAAL, HCF .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (08) :784-785
[8]  
FECHT HJ, 1994, NATO ADV SCI INST SE, V260, P125
[9]  
FOUGERE GE, 1995, THESIS NW U EVANSTON
[10]   NANOCRYSTALLINE MATERIALS [J].
BIRRINGER, R .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, 117 :33-43