Correlation between frequency-sweep hysteresis and phase imaging instability in tapping mode atomic force microscopy

被引：7

作者：

Bar, G

Brandsch, R

Whangbo, MH

机构：

[1] Freiburger Mat Forschungszentrum, D-79104 Freiburg, Germany

[2] N Carolina State Univ, Dept Chem, Raleigh, NC 27695 USA

来源：

SURFACE SCIENCE | 1999年 / 436卷 / 1-3期

关键词：

frequency-sweep hysteresis; phase imaging instability; surface analysis; tapping mode atomic force microscopy; (TMAFM);

D O I：

10.1016/S0039-6028(99)00702-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Frequency-sweep and phase imaging experiments of tapping mode atomic force microscopy were carried out for patterned self-assembled monolayers of S(CH2)(15)CH3 and S (CH2)(12)OH groups on a polycrystalline Au substrate. The phase shift values of opposite signs associated with phase imaging instability are shown to be the same as the corresponding ones resulting from frequency-sweep hysteresis. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

收藏

页码：L715 / L723

页数：9

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