Characterization of Te/Zn/Te ... Multilayers deposited by RF-sputtering

被引：6

作者：

Bellakhder, H ^{[1
]}

Debbagh, F ^{[1
]}

Outzourhit, A ^{[1
]}

Bennouna, A ^{[1
]}

Brunel, M ^{[1
]}

Ameziane, EL ^{[1
]}

机构：

[1] CNRS,CRISTALLOG LAB,F-38042 GRENOBLE,FRANCE

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 1997年 / 45卷 / 04期

关键词：

RF-sputtering; Te/Zn/Te multilayers; II-VI; ZnTe;

D O I：

10.1016/S0927-0248(96)00083-9

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Structures consisting of alternating Te and Zn layers were prepared by RF-sputtering. Grazing incidence X-ray diffraction (GIXD) measurements revealed the formation of ZnTe and the existence of free Zn in as-deposited samples. Similar measurements on samples annealed for 2 h at 300 degrees C showed enhanced crystallinity of ZnTe as well as the formation of oxides when annealing time is extended to 8 h. UV-Visible-NIR transmission measurements showed that metallic-type absorption dominates in as-deposited samples. Annealed samples at 300 degrees C showed well defined absorption edges with an energy gap of 2.50 eV for annealing times of 2 h and 2.24 eV when the annealing time is extended to 8 h.

引用

页码：361 / 368

页数：8

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