Orientation dependence of strained-Ge surface energies near (001): Role of dimer-vacancy lines and their interactions with steps

被引:11
作者
Moore, CJ [1 ]
Retford, CM
Beck, MJ
Asta, M
Miksis, MJ
Voorhees, PW
机构
[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
[2] Northwestern Univ, Dept Engn Sci & Appl Math, Evanston, IL 60208 USA
[3] Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA
[4] Univ Calif Davis, Dept Chem Engn & Mat Sci, Davis, CA 95616 USA
关键词
D O I
10.1103/PhysRevLett.96.126101
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Recent experiments and calculations have highlighted the important role of surface-energy (gamma) anisotropy in governing island formation in the Ge/Si(001) system. To further elucidate the factors determining this anisotropy, we perform atomistic and continuum calculations of the orientation dependence of gamma for strained-Ge surfaces near (001), accounting for the presence of dimer-vacancy lines (DVLs). The net effect of DVLs is found to be a substantial reduction in the magnitude of the slope of gamma vs orientation angle, relative to the highly negative value derived for non-DVL, dimer-reconstructed, strained-Ge(001) surfaces. The present results thus point to an important role of DVLs in stabilizing the (001) surface orientation of a strained-Ge wetting layer.
引用
收藏
页数:4
相关论文
共 23 条
[1]   STABILITIES OF SINGLE-LAYER AND BILAYER STEPS ON SI(001) SURFACES [J].
CHADI, DJ .
PHYSICAL REVIEW LETTERS, 1987, 59 (15) :1691-1694
[2]   Comparative study of dimer-vacancies and dimer-vacancy lines on Si(001) and Ge(001) [J].
Ciobanu, CV ;
Tambe, DT ;
Shenoy, VB .
SURFACE SCIENCE, 2004, 556 (2-3) :171-183
[3]  
Dabrowski J., 2000, SILICON SURFACES FOR
[4]   Phase coexistence during surface phase transitions [J].
Hannon, JB ;
Heringdorf, FJMZ ;
Tersoff, J ;
Tromp, RM .
PHYSICAL REVIEW LETTERS, 2001, 86 (21) :4871-4874
[5]   LAYER-BY-LAYER GROWTH OF GERMANIUM ON SI(100) - STRAIN-INDUCED MORPHOLOGY AND THE INFLUENCE OF SURFACTANTS [J].
KOHLER, U ;
JUSKO, O ;
MULLER, B ;
HORNVONHOEGEN, M ;
POOK, M .
ULTRAMICROSCOPY, 1992, 42 :832-837
[6]   Convergence properties of the Nelder-Mead simplex method in low dimensions [J].
Lagarias, JC ;
Reeds, JA ;
Wright, MH ;
Wright, PE .
SIAM JOURNAL ON OPTIMIZATION, 1998, 9 (01) :112-147
[7]   Effect of strain on structure and morphology of ultrathin Ge films on Si(001) [J].
Liu, F ;
Wu, F ;
Lagally, MG .
CHEMICAL REVIEWS, 1997, 97 (04) :1045-1061
[8]  
MO YW, 1990, PHYS REV LETT, V65, P1020, DOI 10.1142/S0217984990001732
[9]  
NOCEDAL J, 1980, MATH COMPUT, V35, P773, DOI 10.1090/S0025-5718-1980-0572855-7
[10]   EQUILIBRIUM STRUCTURES OF SI(100) STEPPED SURFACES [J].
POON, TW ;
YIP, S ;
HO, PS ;
ABRAHAM, FF .
PHYSICAL REVIEW LETTERS, 1990, 65 (17) :2161-2164