Tapping-mode atomic force microscopy and phase-imaging in higher eigenmodes

被引：85

作者：

Stark, RW ^{[1
]}

Drobek, T ^{[1
]}

Heckl, WM ^{[1
]}

机构：

[1] Univ Munich, Inst Kristallog & Angew Mineral, D-80333 Munich, Germany

来源：

APPLIED PHYSICS LETTERS | 1999年 / 74卷 / 22期

关键词：

D O I：

10.1063/1.123323

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Tapping-mode atomic force microscopy (TM-AFM) is a powerful tool to study soft biological samples. Higher eigenmodes of the vibrating cantilever offer enhanced signal and smaller time constants increasing the sensitivity of the tapping probe as compared to conventional TM-AFM. The first five eigenmodes of a upsilon-shaped silicon cantilever were investigated with respect to their suitability for imaging. Stable imaging was possible in the first and third modes. Phase imaging in the third mode was extremely sensitive to surface inhomogeneities and surface contamination particles not visible in standard TM-AFM. (C) 1999 American Institute of Physics. [S0003-6951(99)01222-X].

引用

页码：3296 / 3298

页数：3

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