Comparative AES studies of grain boundary diffusion in thin polycrystalline Ag/Pd, Au Pd and Cu Pd films

An analysis of the measurements of grain boundary diffusion in the Ag/Pd, Au/Pd and Cu/Pd couples in the temperature range of 393-573 K was performed. Two methods were independently used for determination of the grain boundary diffusion coefficients and/or activation energies of grain boundary diffusion: the so-called first appearance method and the simplified surface accumulation method. Auger electron spectroscopy (AES) was used as a measurement technique for the determination of diffusion-induced concentration changes of the diffusing species. Diffusion data obtained by using two different methods have been analysed and compared. (C) 1999 Elsevier Science B.V. All rights reserved.