Chemical sputtering of hydrocarbon films by low-energy Ar+ ion and H atom impact

被引:61
作者
Hopf, C [1 ]
von Keudell, A [1 ]
Jacob, W [1 ]
机构
[1] EURATOM, Max Planck Inst Plasmaphys, Ctr Interdisciplinary Plasma Sci, D-85748 Garching, Germany
关键词
D O I
10.1088/0029-5515/42/12/101
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Erosion of hydrocarbon films is investigated in a particle-beam experiment employing sources for argon ions and hydrogen atoms. Sputtering by argon ions sets in above a threshold of 58 eV and reaches a yield of 0.5 at an ion energy of 800 eV. Sputtering by argon ions with an additional flux of thermal hydrogen atoms towards the surface occurs above a threshold of 1.3 eV and reaches a yield of about three at an ion energy of 800 eV and a hydrogen atom to argon ion flux ratio of 400. A pronounced dependence of the Yield on this flux density ratio is observed. It is proposed that the shift of the threshold energy as well as the change in the absolute yields is due to the process of chemical sputtering: within a collision cascade of the incident ions, broken bonds are instantaneously passivated by the abundant flux of atomic hydrogen. This leads to the formation of hydrocarbon molecules within the ion penetration range, which diffuse to the surface and desorb. This has important implications for the lifetime of plasma wall components in the divertor region of next step nuclear fusion devices.
引用
收藏
页码:L27 / L30
页数:4
相关论文
共 19 条
[1]  
[Anonymous], 1991, COMPUTER SIMULATION
[2]   Evaluation of chemical erosion data for carbon materials at high ion fluxes using Bayesian probability theory [J].
Dose, V ;
Preuss, R ;
Roth, J .
JOURNAL OF NUCLEAR MATERIALS, 2001, 288 (2-3) :153-162
[3]   INCIDENT ANGLE DEPENDENCE OF SPUTTERING YIELDS FOR HYDROGEN BOMBARDMENT OF LIGHT-ELEMENTS [J].
ECKSTEIN, W ;
SAGARA, A ;
KAMADA, K .
JOURNAL OF NUCLEAR MATERIALS, 1987, 150 (03) :266-271
[4]   Assessment of erosion and tritium codeposition in ITER-FEAT [J].
Federici, G ;
Brooks, JN ;
Coster, DP ;
Janeschitz, G ;
Kukuskhin, A ;
Loarte, A ;
Pacher, HD ;
Stober, J ;
Wu, CH .
JOURNAL OF NUCLEAR MATERIALS, 2001, 290 :260-265
[5]  
Garcia-Rosales C., 1994, J NUCL MATER, V218, P8
[6]  
HOPF C, 2002, UNPUB J APPL PHYS
[7]  
Kuppers J., 1995, Surface Science Reports, V22, P249, DOI 10.1016/0167-5729(96)80002-1
[8]   Model for the chemical erosion of graphite due to low-energy H+ and D+ impact [J].
Mech, BV ;
Haasz, AA ;
Davis, JW .
JOURNAL OF APPLIED PHYSICS, 1998, 84 (03) :1655-1669
[9]   MODELING AND COMPUTER-SIMULATION OF ION-BEAM-ASSISTED AND PLASMA-ASSISTED FILM GROWTH [J].
MOLLER, W .
THIN SOLID FILMS, 1993, 228 (1-2) :319-325
[10]  
MOLLER W, 1987, APPL PHYS LETT, V50, P1870, DOI 10.1063/1.97670