Metal wire definition by high resolution imprint and lift-off

被引:11
作者
Eisert, D
Braun, W
Kuhn, S
Koeth, J
Forchel, A
机构
[1] Nanoplus Nanosystems and Technol. G.
[2] Technische Physik, Univ. Würzburg, D-97074 Würzburg, Am Hubland
关键词
D O I
10.1016/S0167-9317(99)00056-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Metal wires down to 25 nm width were fabricated using a simple imprint technology yet showing high resolution. The patterns were transferred with high geometric control from the silicon mold into a 100 nm thick PMMA layer by pressing the mold into die resist at a temperature of 140 degrees C for 20 min. Then the PMMA layer was thinned by Argon plasma etching and 10 nm thick Gold wires were defined by evaporation and lift-off. Similarly, by imprint in a three layer resist structure with an intermediate metal layer used as an etch stop 25 nm wide wires could be defined with larger process latitude.
引用
收藏
页码:179 / 181
页数:3
相关论文
共 4 条
[1]   Sub-10 nm imprint lithography and applications [J].
Chou, SY ;
Krauss, PR ;
Zhang, W ;
Guo, LJ ;
Zhuang, L .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (06) :2897-2904
[2]  
CHOU SY, 1995, APPL PHYS LETT, V67, P3144
[3]   Nanoscale silicon field effect transistors fabricated using imprint lithography [J].
Guo, LJ ;
Krauss, PR ;
Chou, SY .
APPLIED PHYSICS LETTERS, 1997, 71 (13) :1881-1883
[4]   Mold-assisted nanolithography: A process for reliable pattern replication [J].
Haisma, J ;
Verheijen, M ;
vandenHeuvel, K ;
vandenBerg, J .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06) :4124-4128